A connection between uniformity and aberration in regular fractions of two-level factorials

Kai Tai Fang; Rahul Mukerjee

doi:10.1093/biomet/87.1.193

A connection between uniformity and aberration in regular fractions of two-level factorials

Kai Tai Fang, Rahul Mukerjee

Research output: Contribution to journal › Article › peer-review

104 Citations (Scopus)

Abstract

We show a link between the two apparently unrelated areas of uniformity and minimum aberration. With reference to regular fractions of two-level factorials, we derive an expression for the centred L₂-discrepancy measure for uniformity in terms of the word-length pattern. This result indicates, in particular, excellent behaviour of minimum aberration designs with regard to uniformity and provides further justification for the popular criterion of minimum aberration.

Original language	English
Pages (from-to)	193-198
Number of pages	6
Journal	Biometrika
Volume	87
Issue number	1
DOIs	https://doi.org/10.1093/biomet/87.1.193
Publication status	Published - 1 Mar 2000
Externally published	Yes

Scopus Subject Areas

Statistics and Probability
Mathematics(all)
Agricultural and Biological Sciences (miscellaneous)
Agricultural and Biological Sciences(all)
Statistics, Probability and Uncertainty
Applied Mathematics

User-Defined Keywords

Centred L2-discrepancy
Fractional factorial design
Minimum aberration
Uniformity
Word-length pattern

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10.1093/biomet/87.1.193

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abstract = "We show a link between the two apparently unrelated areas of uniformity and minimum aberration. With reference to regular fractions of two-level factorials, we derive an expression for the centred L2-discrepancy measure for uniformity in terms of the word-length pattern. This result indicates, in particular, excellent behaviour of minimum aberration designs with regard to uniformity and provides further justification for the popular criterion of minimum aberration.",

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AB - We show a link between the two apparently unrelated areas of uniformity and minimum aberration. With reference to regular fractions of two-level factorials, we derive an expression for the centred L2-discrepancy measure for uniformity in terms of the word-length pattern. This result indicates, in particular, excellent behaviour of minimum aberration designs with regard to uniformity and provides further justification for the popular criterion of minimum aberration.

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A connection between uniformity and aberration in regular fractions of two-level factorials

Abstract

Scopus Subject Areas

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