用於物理到圖像/圖像到物理配准和圖像驗證的多個表面

Tai Chiu Richard HSUNG; Yu Hang Walter LAM; Wai Kuen Henry LUK; Yuk Tung Henry NGAN; Ho Nang Edmond POW

用於物理到圖像/圖像到物理配准和圖像驗證的多個表面

Tai Chiu Richard HSUNG (Inventor), Yu Hang Walter LAM (Inventor), Wai Kuen Henry LUK (Inventor), Yuk Tung Henry NGAN (Inventor), Ho Nang Edmond POW (Inventor)

Research output: Patent

Original language	Chinese (Simplified)
IPC	G01-NH-MSPI-CN01
Priority date	23/02/17
Filing date	13/02/17
Publication status	Published - 15 Nov 2019
Externally published	Yes

Cite this

@misc{33eb0b494a4f4fbd9fb61275d31aa681,

title = "用於物理到圖像/圖像到物理配准和圖像驗證的多個表面",

author = "HSUNG, {Tai Chiu Richard} and LAM, {Yu Hang Walter} and LUK, {Wai Kuen Henry} and NGAN, {Yuk Tung Henry} and POW, {Ho Nang Edmond}",

year = "2019",

month = nov,

day = "15",

language = "Chinese (Simplified)",

type = "Patent",

note = "G01-NH-MSPI-CN01",

}