Keyphrases
266 Nm Laser
9%
Ablating
15%
Aluminum-silicon Alloy
9%
Analytical Techniques
7%
ArF Laser
36%
Atomic Fluorescence
15%
Atto
6%
Black Ink
18%
Chemical Fingerprinting
9%
Chemometrics
21%
Class Membership Probability
18%
Classification Scheme
18%
Denoising Method
9%
Destructive Analysis
9%
Double Pulse
9%
Double-pulse Laser Ablation
18%
Elemental Analysis
18%
Energy Levels
6%
Excitation Wavelength
6%
Fluorescence Characterization
18%
Fluorescence Mechanism
18%
Fluorescence Spectra
31%
Forensic Document
9%
Fourier Transform Infrared Spectroscopy (FT-IR)
9%
Gas Plume
9%
Hard Classification
9%
Highly Reliable
9%
Intensity Fluctuation
9%
Laser Beams
6%
Laser Fluence
9%
Laser Plume
22%
Laser Pulse
36%
Laser Sampling
18%
Laser-induced Breakdown Spectroscopy
9%
Laser-induced Fluorescence
18%
Linear Process
9%
Magnesium
9%
Material Analysis
9%
Membership Probability
9%
Mica
9%
Multi-analyte
28%
Multi-element Analysis
18%
Nave Bayes Classifier
9%
Non-selective
5%
Order of Magnitude
9%
Partial Least Squares Discriminant Analysis (PLS-DA)
13%
Photoexcitation
6%
Plasma Emission
11%
Plume
100%
Preprocessing Schemes
9%
Principal Coordinate Analysis (PCoA)
9%
RBF Kernel
9%
Sample Enhancement
18%
Sample Mass
9%
Sampling Methods
18%
Seal Inks
18%
Signal Enhancement
9%
Signal Uncertainty
9%
Single Sample
18%
Sodium
9%
Soft Classification
18%
Spectral Area
18%
Spectral Denoising
9%
Spectral Noise
18%
Spectral Preprocessing
9%
Spectral Properties
9%
Spectrochemical Analysis
18%
Temporal Properties
9%
Ultraviolet Laser
9%
Unknown Samples
9%
Xuan Paper
18%
Chemistry
Aluminum
18%
Chemical Element
18%
Chemometrics
42%
Copper Atom
6%
Electronic Excitation
6%
Elemental Analysis
18%
Energetics
6%
Energy State
6%
Excited State
18%
Fluorescence Emission
6%
Fluorescence Spectrum
24%
Fourier Transform Infrared Spectroscopy
12%
Laser Ablation
18%
Laser Induced Breakdown Spectroscopy
18%
Laser Induced Fluorescence Spectroscopy
18%
Laser Pulse
66%
Lead Atom
6%
Lineshape
18%
Magnesium
9%
Photoexcitation
18%
pigment
6%
Potable Water
18%
Red
18%
Silicon
9%
Sodium
9%
Spectroscopy
18%
Time-Resolved Spectroscopy
18%
Tin
6%
Tin Atom
6%
Trace Analysis
6%
Vaporization
18%
X-Ray Fluorescence Spectroscopy
12%
Zinc Atom
6%
Engineering
Bayes Classifier
9%
Classification Scheme
18%
Component Analysis
18%
Electronic Excitation
9%
Energetics
9%
Energy State
9%
Enhanced Signal
18%
Excitation Energy
18%
Fluorescence Emission
9%
Fourier Transform
18%
FTIR Spectroscopy
18%
Gaussians
9%
Hard Classification
9%
Intensity Fluctuation
18%
Laser Fluence
18%
Laser Probe
18%
Least Square
27%
Minimum Detectable Mass
18%
Pretreatment
18%
Principal Component
18%
Radial Basis Function
9%
Rate Class
9%
Sample Mass
18%
Similarity
9%
Test Sample
9%
Thin Layer
18%
White Noise
18%
X-Ray Fluorescence
18%